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Kelvin Force Microscopy - 開爾文力顯微鏡

Work function measurement on Atomic level.
Single pass scanning as new technique on KP-AFM

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  1. Single pass scanning on sample. ( No LIFT )
  2. 2 Lock-in device in AFM.
  3. Much higher SENSITIVITY.
  4. Much higher RESOLUTION.
Difference

Standard KFM
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HD-KFM

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功函數量測儀 1246566